Introduction
Our research project offers motivated students a unique opportunity to delve into the world of nanoscale science and technology. The focus is on the integration of Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM), with additional learning about in-situ Transmission Electron Microscopy (TEM). This project is ideal for those passionate about advanced microscopy techniques and eager for hands-on experience.
Project Overview
Participants in this project will explore the capabilities of an integrated AFM-SEM system and gain insights into in-situ TEM. This involves understanding each methodology, conducting experiments, and analysing results to understand various materials' topography, composition, and dynamic behaviours.
Learning Objectives
Atomic Force Microscopy (AFM):
- AFM uses a sharp probe to scan the sample surface, providing detailed topographical maps at the atomic level. It measures surface roughness, mechanical properties, and nanostructures.
- Participants will learn AFM operation, sample preparation, and data interpretation.
Scanning Electron Microscopy (SEM):
- SEM produces high-resolution images and compositional information using focused electron beams. It provides detailed surface morphology and elemental analysis through techniques like Energy Dispersive X-ray Spectroscopy (EDS).
- Participants will gain hands-on experience with SEM operation, including sample preparation, image acquisition, and data interpretation.
In-Situ Transmission Electron Microscopy (TEM):
- TEM provides high-resolution images by transmitting electrons through a sample. In-situ TEM allows real-time observation of dynamic processes at the atomic scale, such as phase transitions, chemical reactions, and mechanical deformations.
- Participants will learn the basics of TEM operation, sample preparation, and how to perform and analyze in-situ experiments.
Benefits of Participation
1. Hands-On Experience: Practical experience with advanced microscopy techniques widely used in research and industry.
2. Skill Development: Development of valuable skills in sample preparation, microscopy operation, and data analysis, enhancing technical expertise.
3. Mentorship and Collaboration: Close collaboration with experienced researchers and technicians, providing insights into the scientific research process and opportunities to build a professional network.
4. Cutting-Edge Research: Contribution to ongoing research projects utilising AFM, SEM, and TEM to solve real-world problems in nanotechnology, materials science, and biology.
5. Publication and Presentation Opportunities: Potential for co-authorship on research papers and presentations at scientific conferences, providing a platform to showcase participants' work.
Project Activities
1. **Introduction to AFM, SEM, and TEM**:
- Training sessions to understand the principles, operation, and applications of AFM, SEM, and TEM.
- Review of literature on the integration of these techniques and their impact on nanoscale research.
2. **Sample Preparation**:
- Learning various techniques for preparing samples suitable for AFM, SEM, and TEM analysis.
- Preparation and testing of samples from different materials such as metals, polymers, and biological specimens.
3. **Microscopy Operation**:
- Conducting AFM and SEM imaging of prepared samples, optimising parameters to achieve the best resolution and contrast.
- Performing in-situ TEM experiments to observe dynamic processes in real time.
4. **Data Analysis and Interpretation**:
- Analysing acquired data to understand the topographical, morphological, and compositional characteristics of the samples.
- Correlating findings from AFM, SEM, and TEM to draw comprehensive conclusions.
5. **Reporting and Presentation**:
- Documentation of findings and preparation of a final report summarising the research.
- Presentation of results to the research team, highlighting key insights and potential future directions.
